Article

Plasma Investigations
2002. V. 40. № 6. P. 814–817
Kacher I.E., Shuaibov A.K., Rigan M.Yu., Dashchenko A.I.
Optical Diagnostics of Laser Evaporation of $\mathrm{CuInS}_2$ Polycrystalline Compound
Annotation
In the radiation spectrum of the erosion laser plasma of $\mathrm{CuInS}_2$ polycrystalline compound, the presence of resonance spectral lines of $\mathrm{CuI}$ and $\mathrm{InI}$ is revealed, as well as of spectral lines which correspond to cascade transitions and of lines from the displaced terms of the copper atom. No intense radiation of positive ions is observed in the spectral range from $200$ to $600$ nm. The binding energies of $\mathrm{Cu}$–$\mathrm{S}$, $\mathrm{In}$–$\mathrm{S}$, $\mathrm{Cu}$–$\mathrm{Cu}$, $\mathrm{In}$–$\mathrm{In}$, and $\mathrm{Cu}$–$\mathrm{In}$ atoms, as well as atomic and orbital bond orders of the $\mathrm{CuInS}_2$ cluster, are calculated by the Hueckel pseudoempirical method within the valent approximation. It is found that $\mathrm{In}(\textit1$, $\textit3)$ atoms inversely centering the lower faces of cations $\mathrm{Cu}(\textit6$, $\textit6^{\text{I}})$, as well as cations $\mathrm{Cu}(\textit4$, $\textit4^{\text{I}})$ and $\mathrm{In}(\textit5$, $\textit5^{\text{I}})$ centering the lateral faces of the crystal, do not form strong bonds in the structure. Therefore, in the evaporation processes they must easily evolve from the structure of the $\mathrm{CuInS}_2$ chalcopyrite crystal and make a predominant contribution to the radiation spectrum of laser plasma. From the standpoint of energy, the atoms of sulfur and nodal atoms of copper evaporate mainly in the form of combined complexes of $\mathrm{CuS}$ molecules. One can assume that the initial growth layers will be obtained with a deficiency in sulfur and with substantial violation of their stoichiometry and the structure of the initial compound.
Article reference:
Kacher I.E., Shuaibov A.K., Rigan M.Yu., Dashchenko A.I. Optical Diagnostics of Laser Evaporation of $\mathrm{CuInS}_2$ Polycrystalline Compound, High Temp., 2002. V. 40. № 6. P. 814